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p4-hp-lt-xrd-spectroscopy - PETRA-IV workgroup for high pressure beamline (spectroscopy+diffraction)

Subject: PETRA-IV workgroup for high pressure beamline (spectroscopy+diffraction)

Home page for the project of PETRA-IV end station combining spectroscopy and X-ray diffraction.

The project corresponds to the TDR phase proposal submission.
This is an initial stage of discussion. The topics are listed below.

We discuss a concept of a completely new end station with a focus on studying complex systems using a combination of different techniques.

Scientific Challenges of the community to be addressed, selection of the most important cases for the proposal

This involves a discussion of the capabilities involving the future end station operation (User perspective)

  1. Energy range
  2. Flux expectations
  3. Focal size on the sample

Techniques important for the community (combination of techniques)

This involves a discussion of the capabilities involving the future end station operation from the user perspective with the prioritization.

  1. XRD in many variations, including a Soller slit
  2. XRD + XES
  3. XRD + XAS (XANES? EXAFS? XMCD?)
  4. XRD + fluorescence
  5. XRD + spectroscopy + res. heating?
  6. XRD + spectroscopy + laser heating?
  7. XRD + spectroscopy + cryostat?

Sample environments important for the user community

This involves a discussion of the capabilities involving the future end station operation from the user perspective with the prioritization.

  1. cryostats (temperature range, methodology used - electrical resistivity? NMR? XMCD?)
  2. resistive heating (temperature range, methodology used?)
  3. laser heating (methodology used?)

Beamline related components and characteristics

Optic components

The spectroscopy beamline needs a bit different characteristics in comparison with a pure diffraction beamline

  1. Energy range - undulators + monochromators
  2. Flux expectations (XANES?, XMCD?, EXAFS?)
  3. Focal size on the sample (Compound refractive lenses, KB)
  4. Larger focusing for larger samples?
  5. Imaging (direct beam, projection with focused beam, microscopy - lenses between sample and imaging microscope)

Sample stack capabilities

Depending on the tasks we can use different approaches and different stacks. Low temperature stacks are usually required to carry more weight. The same applies to the vacuum chambers for the resistive heating. Soller slits should belong to the concept of the sample stack capability.

  1. heavy stack for cryostats
  2. micron to submicron focusing - special stages
  3. fast scanning capabilities?
  4. goniometer (4 circle?)
  5. Soller slit?

Spectrometer and other detector capabilites

It will be mostly driven by the techniques selected upon the first stages of the discussion.

  1. Large detectors for modern diffraction (Varex)
  2. Faster detectors for XRD (Dectris CdTe? Lambda?)
  3. Spectroscopy compatible detectors (fluorescence, XES, XANES, EXAFS, XMCD?); Focal range is important for the fluorescence.

Discussion on the completely new capabilities

It will be mostly driven by the techniques selected upon the first stages of the discussion.

  1. imaging (interest? model systems?)
  2. something else?
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